The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing
Author:
Affiliation:
1. Iowa State University,Ames,USA
2. Texas Instruments Inc.
Funder
Texas Instruments
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9793839/9794139/09794216.pdf?arnumber=9794216
Reference13 articles.
1. Investigation of polynomial normal transform
2. Monotonic Expression of Polynomial Normal Transformation Based on the First Four L-Moments
3. Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation
4. An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study
5. Detection of Site to Site Variations from Volume Measurement Data in Multi-site Semiconductor Testing
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