Detection of Site to Site Variations from Volume Measurement Data in Multi-site Semiconductor Testing-Reference-Cited by-同舟云学术

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Detection of Site to Site Variations from Volume Measurement Data in Multi-site Semiconductor Testing

Published:2021 Issue: Volume: Page:1-1
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Farayola Praise O.,Chaganti Shravan K.,Obaidi Abdullah O.,Sheikh Abalhassan,Ravi Srivaths,Chen Degang

Funder

Texas Instruments and the Semiconductor Research Corporation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/4407674/09325917.pdf?arnumber=9325917

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction;IEEE Design & Test;2023-10

2. Detecting abnormal behavior of automatic test equipment using autoencoder with event log data;Computers & Industrial Engineering;2023-09

3. Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits;2023-05-11

4. A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing;Journal of Electronic Testing;2023-02

5. A Data-Driven Methodology for Analyzing Field Nonconformities in Semiconductor Production Applied to a Brazilian Manufacturer;Proceedings of the 8th Brazilian Technology Symposium (BTSym’22);2023

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