Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction
Author:
Affiliation:
1. Iowa State University, Ames, IA, USA
2. Texas Instruments Inc., Dallas, TX, USA
3. Texas Instruments Inc., Bengaluru, India
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
http://xplorestaging.ieee.org/ielx7/6221038/10233150/10080985.pdf?arnumber=10080985
Reference24 articles.
1. Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation
2. Improving calibration to ensure better correlation between different EMC test facilities
3. Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing
4. Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing
5. Site dependencies in a multisite testing environment
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