Author:
Yu Xiaochun,Blanton Ronald DeShawn
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
19 articles.
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1. Diagnosis of Double Faults Consisting of a Stuck-at Fault and a Transition Fault;2024 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2024-07-02
2. Gradient Boosting-Accelerated Evolution for Multiple-Fault Diagnosis;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
3. Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks;2022 IEEE International Test Conference (ITC);2022-09
4. Partially-Specified Output Response for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
5. Hybrid Pass/Fail and Full Fail Data for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021-08