Funder
Semiconductor Research Corporation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
6 articles.
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1. Translating Test Responses to Images for Test-termination Prediction via Multiple Machine Learning Strategies;ACM Transactions on Design Automation of Electronic Systems;2024-08-13
2. Dummy Faulty Units for Reduced Fail Data Volume From Logic Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-11
3. CNN-based Data-Model Co-Design for Efficient Test-termination Prediction;2022 IEEE European Test Symposium (ETS);2022-05-23
4. Partially-Specified Output Response for Reduced Fail Data Volume;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022
5. Logic Diagnosis with Hybrid Fail Data;ACM Transactions on Design Automation of Electronic Systems;2021-05-31