Funder
Institutional Strategy of the University of Bremen funded by the German Excellence Initiative
German Research Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
14 articles.
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1. A Static Test Compaction Method Based on GCN Assisted Fault Gate Classification;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18
2. A Graph Partitioning Approach to Optimize Test Patterns;Lecture Notes in Networks and Systems;2024
3. Reducing Output Response Aliasing Using Boolean Optimization Techniques;2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS);2023-05-03
4. A New Static Compaction of Deterministic Test Sets;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04
5. Neural Fault Analysis for SAT-based ATPG;2022 IEEE International Test Conference (ITC);2022-09