Defect-Oriented Testing of RF Circuits-Reference-Cited by-同舟云学术

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Defect-Oriented Testing of RF Circuits

Published:2008-05 Issue:5 Volume:27 Page:920-931
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Acar Erkan,Ozev Sule

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx5/43/4492824/04492825.pdf?arnumber=4492825

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