AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate-Reference-Cited by-同舟云学术

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AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate

Published:2024-05-20 Issue: Volume: Page:1-4
ISSN:
Container-title:2024 IEEE European Test Symposium (ETS)
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Author:

Komarraju Suhasini¹,Mejri Mohamed¹,Tammana Akhil¹,Dharmaraj Gowsika¹,Amarnath Chandramouli N¹,Chatterjee Abhijit¹

Affiliation:

1. Georgia Institute of Technology,School of Electrical and Computer Engineering,Atlanta,USA

Funder

Intel Corporation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10567048/10567052/10567386.pdf?arnumber=10567386

Reference14 articles.

1. Signature Testing of Analog and RF Circuits: Algorithms and Methodology

2. Low-Cost Test of Embedded RF/Analog/Mixed-Signal Circuits inSOPs

3. Defect-Oriented Testing of RF Circuits

4. Test pattern generation for analog circuits using neural networks and evolutive algorithms

5. Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures

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