Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures-Reference-Cited by-同舟云学术

Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures

Published:2011-01-06 Issue:3 Volume:27 Page:277-288
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Barragán Manuel J.,Fiorelli Rafaella,Leger Gildas,Rueda Adoración,Huertas José L.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-010-5193-4.pdf

Reference33 articles.

1. Abdallah L, Stratigopoulos H, Kelma C, Mir S (2010) Sensors for built-in alternate RF test. In: Proc. of IEEE European Test Symposium (ETS), pp 49–54

2. Acar E, Ozev S (2005) Defect-based RF testing using a new catastrophic fault model. In: Proc. of IEEE international test conference ITC, p 429

3. Acar E, Ozev S (2005) Diagnosis of the failing component in RF receivers through adaptive full-path measurements. In: Proc. of IEEE VLSI test symposium, pp 374–379

4. Akbay SS, Chatterjee A (2005) Built-in test of RF components using mapped feature extraction sensors. In: Proc. of IEEE VLSI test symposium, pp 243–248

5. Aldrete-Vidrio E, Mateo D, Altet J, Salhi MA, Grauby S, Dilhaire S, Onavajo M, Silva-Martinez J (2010) Strategies for built-in characterization testing and performance monitoring of analog rf circuits with temperature measurements. Meas Sci Technol 21(7):1–10

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate;2024 IEEE European Test Symposium (ETS);2024-05-20

2. Refined Self-calibration of an Inductorless Low-noise Amplifier with Non-intrusive Circuit;Journal of Electronic Testing;2023-01-10

3. An Intelligent Sensing Framework for Post-Manufacturing Performance Measurement and Healing of CSVCO;IEEE Transactions on Instrumentation and Measurement;2023

4. A methodology for defect detection in analog circuits based on causal feature selection;2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2022-10-24

5. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22