Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements-Reference-Cited by-同舟云学术

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Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Published:2010-06-08 Issue:7 Volume:21 Page:075104
ISSN:0957-0233
Container-title:Measurement Science and Technology
language:
Short-container-title:Meas. Sci. Technol.

Author:

Aldrete-Vidrio Eduardo,Mateo Diego,Altet Josep,Salhi M Amine,Grauby Stéphane,Dilhaire Stefan,Onabajo Marvin,Silva-Martinez Jose

Publisher

IOP Publishing

Subject

Applied Mathematics,Instrumentation,Engineering (miscellaneous)

Reference26 articles.

1. Statistical Test Development for Analog Circuits Under High Process Variations

2. A Broadband CMOS Amplitude Detector for On-Chip RF Measurements

3. A Translinear RMS Detector for Embedded Test Of RF ICs

4. A Current Injection Built-In Test Technique for RF Low-Noise Amplifiers

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1. BPF-Based Thermal Sensor Circuit for On-Chip Testing of RF Circuits;Sensors;2021-01-26

2. Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology;Sensors;2019-11-05

3. Developing a High-Power Multilayer Ceramic Capacitor Qualification Test Setup for RF Subsystems;IEEE Transactions on Instrumentation and Measurement;2019-09

4. Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging;IEEE Transactions on Instrumentation and Measurement;2019-08

5. Single-MOSFET DC thermal sensor for RF-amplifier central frequency extraction;Sensors and Actuators A: Physical;2017-09

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