A Continuum Damage Mechanics Approach for the Reliability of Lead-Free Solders Subjected to Cyclic Loading
Author:
Affiliation:
1. Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3) Auburn University,Auburn,AL,USA,36849
2. NXP Semiconductors,Austin,TX,USA
3. Munich,GERMANY
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10195193/10195244/10195782.pdf?arnumber=10195782
Reference20 articles.
1. Creep and Microstructure Evolutions in SAC305 Lead Free Solder Subjected to Different Thermal Exposure Profiles;hasan;Proceedings of the 72nd IEEE Electronic Components and Technology Conference,0
2. Mechanical Property Evolution in SAC+Bi Lead-Free Solders Subjected to Various Thermal Exposure Profiles
3. Mechanical Properties and Microstructural Fatigue Damage Evolution in Cyclically Loaded Lead-Free Solder Joints
4. Microstructure evolution in a Pb-free solder alloy during mechanical fatigue
5. Damage Evolution in SAC Solder Alloys
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Analytical and experimental studies on the damage evolution of SAC solder alloys;2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2023-04-17
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