A comparative study of the thermomechanical reliability of fully-filled and conformal through-glass via

Author:

Pan Ke1,Okoro Chukwudi2,Lai Yangyang1,Joshi Dhananjay3,Park Seungbae1,Pollard Scott4

Affiliation:

1. Binghamton University,Mechanical Engineering Department,Binghamton,USA

2. Corning Research and Development Corporation,Mechanics and Reliability Sciences (MaRS),Corning,USA

3. Manufacturing Technology and Engineering Corning Incorporated,Corning,USA

4. Corning Research and Development Corporation,Integration Technologies Department,Corning,USA

Funder

Research and Development

Publisher

IEEE

Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Thermo-mechanical reliability of glass substrate and Through Glass Vias (TGV): A comprehensive review;Microelectronics Reliability;2024-10

2. A review on warpage measurement metrologies for advanced electronic packaging;Microelectronics Reliability;2024-09

3. Modeling and Characterization of Annealing Effect on the Cu Protrusion and Thermomechanically Behaviors of Through Glass Via;IEEE Transactions on Components, Packaging and Manufacturing Technology;2024-07

4. Adhesion Layer Influence on Thermomechanical Reliability of Electroplated Copper Through-Glass Via (TGV);2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

5. Influence of Stiffener Design on Co-Packaged Optics (CPO) 2.5D Heterogeneous Packages;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

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