Panel Level Packaging – Where are the Technology Limits?

Author:

Braun Tanja1,Holck Ole1,Obst Mattis1,Voges Steve1,Kahle Ruben1,Bottcher Lars1,Billaud Mathilde1,Stobbe Lutz1,Becker Karl-Friedrich1,Aschenbrenner Rolf1,Voitel Marcus2,Schein Friedrich-Leonhard2,Gerholt Lutz2,Schneider-Ramelow Martin2

Affiliation:

1. Fraunhofer Institute for Reliability and Microintegration,Berlin,Germany

2. Technical University Berlin,Berlin,Germany

Funder

Ministry of Education

Publisher

IEEE

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. How to Manipulate Warpage in Fan-out Wafer and Panel Level Packaging;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

2. Aging Behaviour and Environmental Impact of Under Bump Metallurgies for Wafer Level Balling;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

3. Reliability Challenges and Mitigation Measures of Small Body-Sized Components on Complex and High-Layer Count PCBs;2023 IEEE 73rd Electronic Components and Technology Conference (ECTC);2023-05

4. A Closer Look to Fan-out Panel Level Packaging;2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2023-03-07

5. State-Of-The-Art of Advanced Packaging;Chiplet Design and Heterogeneous Integration Packaging;2023

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