Nanoscale Thermal Transport in Vertical Gate-All-Around Junctionless Nanowire Transistors—Part I: Experimental Methods
Author:
Affiliation:
1. IMS Laboratory, University of Bordeaux, Bordeaux, France
2. LAAS CNRS, UPR 8001, CNRS, Université of Toulouse, Toulouse, France
Funder
Project FVLLMONTI
European Union’s Horizon 2020 Research and Innovation Program
Laboratoire d’Analyse et d’Architecture des Systèmes (LAAS)-Centre National de la Recherche Scientifique (CNRS) Micro and Nanotechnologies Platform, a member of the Renatech French National Network
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/10328902/10278160.pdf?arnumber=10278160
Reference38 articles.
1. Cryogenic Operation of Junctionless Nanowire Transistors
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3. High-Temperature Performance of Silicon Junctionless MOSFETs
4. Thermal characterization of silicon nanowires for thermoelectric applications;puyoo,2010
5. Temperature dependence of electronic behaviors in n-type multiple-channel junctionless transistors
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