Author:
Pawlak Andreas,Krause Julia,Schroter Michael
Funder
German Government DFG
BMBF through Taranto Project
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
6 articles.
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1. Characterization, Analysis and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications;IEEE Transactions on Device and Materials Reliability;2023
2. Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs;2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2022-10-16
3. Device modeling tools and their application to SiGe HBT development;2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2022-10-16
4. An Experimental Load-Pull Based Large-Signal RF Reliability Study of SiGe HBTs;2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2021-12-05
5. From Transistor Parameters to PA Circuit Performance (Invited);2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2021-12-05