Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs-Reference-Cited by-同舟云学术

Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs

Published:2022-10-16 Issue: Volume: Page:
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Container-title:2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
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Author:

Weimer Christoph¹,Jin Xiaodi¹,Fischer Gerhard G.²,Schröter Michael¹

Affiliation:

1. Technische Universität Dresden,Chair for Electron Devices and Integrated Circuits,Dresden,Germany,01062

2. Leibniz-Institut für Innovative Mikroelektronik,IHP,Frankfurt (Oder),Germany,15236

Funder

National Science Foundation

Publisher

IEEE

Link

Reference12 articles.

1. DMT-pylab - A Python-based measurement instruments remote control framework;weimer;Private project,0

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