Total ionizing dose effects on flash-based field programmable gate array-Reference-Cited by-同舟云学术

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Total ionizing dose effects on flash-based field programmable gate array

Published:2004-12 Issue:6 Volume:51 Page:3759-3766
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Wang J.J.,Samiee S.,Chen H.-S.,Huang C.-K.,Cheung M.,Borillo J.,Sun S.-N.,Cronquist B.,McCollum J.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/29973/01369555.pdf?arnumber=1369555

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