Author:
Bill Ulrich,Edge Ronald D.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Nanotip processing on TiO2 surfaces irradiated with fullerenes in the electronic regime;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06
2. Backscattering analysis of thin films on non-flat surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-02
3. Ion beam profiling of small objects using resonant nuclear reactions;Vacuum;1989-01
4. Ion resonance and scattering techniques for measuring surface and subsurface topography, and the shape of microscopic objects;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-06
5. The effects of surface topography in nuclear microprobe Rutherford backscattering analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-03