Ion resonance and scattering techniques for measuring surface and subsurface topography, and the shape of microscopic objects-Reference-Cited by-同舟云学术

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Ion resonance and scattering techniques for measuring surface and subsurface topography, and the shape of microscopic objects

Published:1988-06 Issue:1-4 Volume:33 Page:582-586
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Edge R.D.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. The development of the electron microscope and of electron microscopy

2. Ion Solid Interactions;Gibson,1980

3. Light elements depth-profiling using time-of-flight and energy detection of recoils

4. Surface Roughness Using Rutherford Backscattering

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Backscattering analysis of thin films on non-flat surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-02

2. Deconvolution and simulation of backscattering and reaction spectra;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1989-04

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