The effects of surface topography in nuclear microprobe Rutherford backscattering analysis

Author:

Hobbs C.P.,McMillan J.W.,Palmer D.W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

1. Proc. 4th Int. Conf. on Ion Beam Analysis;Knudson,1980

2. Proc. 3rd Int. Conf. on Ion Beam Analysis;Niiler,1978

3. Backscattering measurements and surface roughness

4. Proc. 6th Int. Conf. on Ion Beam Analysis;Bird,1983

5. Ph.D. Thesis;Bill,1979

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