A built-in current sensor based on current-mode design
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Signal Processing
Link
http://xplorestaging.ieee.org/ielx4/82/14373/00659464.pdf?arnumber=659464
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A current monitoring technique for I testing in digital integrated circuits;Integration;2015-06
2. A built-in current sensor using thin-film transistors;Journal of Physics: Conference Series;2005-01-01
3. A new technique for IDDQ testing in nanometer technologies;Integration;2002-05
4. Extending the viability of I/sub DDQ/ testing in the deep submicron era;Proceedings International Symposium on Quality Electronic Design
5. Built-In Current Sensor with reduced voltage drop using Thin-Film Transistors;2005 IEEE International Symposium on Circuits and Systems
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