Author:
Tsiatouhas Y.,Moisiadis Y.,Haniotakis Th.,Nikolos D.,Arapoyanni A.
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference29 articles.
1. M. Sachdev, Deep Sub-micron IDDQ Testing: Issues and Solutions, European Design and Test Conference (ED&TC), 1997, pp. 271–278.
2. A.E. Gattiker, W. Maly, Toward Understanding “IDDQ-Only” Fails, International Test Conference (ITC), 1998, pp. 174–183.
3. T.W. Williams, R.H. Dennard, R. Kapur, M.R. Mercer, W. Maly, IDDQ Test: Sensitivity Analysis of Scaling, International Test Conference (ITC), 1996, pp. 786–792.
4. S. Kundu, IDDQ Defect Detection in Deep Submicron CMOS ICs, Asian Test Symposium (ATS), 1998, pp. 150–152.
5. A. Ferre, J. Figueras, IDDQ Characterization in Submicron CMOS, International Test Symposium (ITC), 1997, pp. 136–145.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献