Toward understanding "Iddq-only" fails
Author:
Gattiker A.E.,Maly W.
Publisher
Int. Test Conference
Cited by
13 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. IDDQ and Power;CMOS Test and Evaluation;2014-10-07
2. I
DDX
-based test methods;ACM Transactions on Design Automation of Electronic Systems;2004-04
3. A new technique for IDDQ testing in nanometer technologies;Integration;2002-05
4. Current testing procedure for deep submicron devices;Journal of Electronic Testing;2001
5. Iddq testing for CMOS VLSI;Proceedings of the IEEE;2000-04