Author:
Tsiatouhas Y.,Haniotakis Th.,Nicolos D.,Arapoyanni A.
Cited by
3 articles.
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1. A current monitoring technique for I testing in digital integrated circuits;Integration;2015-06
2. Semiconductor test strategies;IEEE Instrumentation & Measurement Magazine;2003-03
3. An embedded I/sub DDQ/ testing architecture and technique;Fourth International Symposium on Quality Electronic Design, 2003. Proceedings.