Author:
Chang Huan-Lin,Li Hsuan-Chih,Liu C. W.,Chen F.,Tsai M.-J.
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Defects, Fault Modeling, and Test Development Framework for RRAMs;ACM Journal on Emerging Technologies in Computing Systems;2022-04-28
2. Eliminating Iterations of Iterative Methods;Proceedings of the 2021 on Great Lakes Symposium on VLSI;2021-06-22
3. Merging Everything (ME);Proceedings of the 56th Annual Design Automation Conference 2019;2019-06-02
4. Filament Growth and Resistive Switching in Hafnium Oxide Memristive Devices;ACS Applied Materials & Interfaces;2018-03-30
5. RTS noise characterization of HfOx RRAM in high resistive state;Solid-State Electronics;2013-06