Suppressed Source-to-Drain Tunneling and Short-Channel Effects for MFIS-type InGaAs and Si Negative-Capacitance FinFETs
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Published:2021-04-19
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Container-title:2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
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Author:
Huang Shih-En,Su Pin
Cited by
10 articles.
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