Unraveling the Dynamics of Charge Trapping and De-Trapping in Ferroelectric FETs-Reference-Cited by-同舟云学术

Unraveling the Dynamics of Charge Trapping and De-Trapping in Ferroelectric FETs

Published:2022-03 Issue:3 Volume:69 Page:1503-1511
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Deng Shan¹^ORCID,Zhao Zijian¹,Kim You Sung²,Duenkel Stefan²,MacMahon David³,Tiwari Ravi⁴^ORCID,Choudhury Nilotpal⁴^ORCID,Beyer Sven²,Gong Xiao⁵^ORCID,Kurinec Santosh⁶^ORCID,Ni Kai⁶^ORCID

Affiliation:

1. Microsystems Engineering Ph.D. Program, Rochester Institute of Technology, Rochester, NY, USA

2. GLOBALFOUNDRIES Fab1 LLC & Company KG, Dresden, Germany

3. Micron Technology Inc., Manassas, VA, USA

4. Department of Electrical Engineering, Indian Institute of Technology Bombay (IIT Bombay), Mumbai, India

5. Department of Electrical Computer Engineering, National University of Singapore, Singapore

6. Department of Electrical and Microelectronic Engineering, Rochester Institute of Technology, Rochester, NY, USA

Funder

Semiconductor Research Corporation (SRC) Global Research Collaboration (GRC) Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/9722602/09696193.pdf?arnumber=9696193

Reference31 articles.

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2. SoC Logic Compatible Multi-Bit FeMFET Weight Cell for Neuromorphic Applications

3. Deconvoluting charge trapping and nucleation interplay in FeFETs: Kinetics and Reliability

4. A Study of Endurance Issues in HfO2-Based Ferroelectric Field Effect Transistors: Charge Trapping and Trap Generation

5. Direct observation of interface charge behaviors in FeFET by quasi-static split C-V and Hall techniques: Revealing FeFET operation;toprasertpong;IEDM Tech Dig,2019

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