Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage-Reference-Cited by-同舟云学术

Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage

Published:2022-09 Issue:9 Volume:69 Page:5316-5323
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Chatterjee Swetaki¹^ORCID,Thomann Simon¹,Ni Kai²^ORCID,Chauhan Yogesh Singh³^ORCID,Amrouch Hussam¹^ORCID

Affiliation:

1. Chair for Semiconductor Test and Reliablility (STAR), University of Stuttgart, Stuttgart, Germany

2. Rochester Institute of Technology, Rochester, NY, USA

3. Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur, India

Funder

United States Army Research Office

German Research Foundation (DFG) “ACCROSS: Approximate Computing aCROss the System Stack,”

Swarna Jayanti Fellowship

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/9864631/09843944.pdf?arnumber=9843944

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