Author:
Sunter S.,Roy A.,Cote J.-F.
Cited by
6 articles.
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1. High Inheritability and Flexibility Smarttest8 Testmethod Library on Ultra-High-Speed Serdes Measurement;2022 China Semiconductor Technology International Conference (CSTIC);2022-06-20
2. Testing HSSIs with or without ATE Instruments;Accelerating Test, Validation and Debug of High Speed Serial Interfaces;2010-10-11
3. Transmitter Jitter Extractions on ATE;Accelerating Test, Validation and Debug of High Speed Serial Interfaces;2010-10-11
4. Qualifying Serial Interface Jitter Rapidly and Cost-effectively;Journal of Electronic Testing;2010-01-06
5. On-Chip Random Jitter Testing Using Low Tap-Count Coarse Delay Lines;Journal of Electronic Testing;2006-11-22