Author:
Fan Yongquan,Zilic Zeljko
Reference38 articles.
1. Y. Fan, Y. Cai and Z. Zilic, "A High Accuracy, High Throughput Jitter Test Solution on ATE for 3 Gbps and 6 Gbps Serial-ATA," Proceedings of IEEE International Test Conference, Oct. 2007
2. S. Sunter, A. Roy, and J. Cote, “An Automated, Complete, Structural Test Solution for SERDES,” Proceedings of IEEE International Test Conference, 2004
3. Y. Fan and Z. Zilic, “Bit Error Rate Testing of Communication Interfaces,” IEEE Transactions on Instrumentation and Measurements, Vol. 57, No. 5, pp. 897-906, May 2008
4. R. Kiefer, Test Solutions for Digital Networks, Huthig GmbH, Heidelberg, 1998
5. S. Sunter and A. Roy, "Structural Tests for Jitter Tolerance in SerDes Receivers," Proceedings of IEEE International Test Conference, 2005