1. Testing HSSIs with or without ATE Instruments;Accelerating Test, Validation and Debug of High Speed Serial Interfaces;2010-10-11
2. Accelerating Receiver Jitter Tolerance Testing on ATE;Accelerating Test, Validation and Debug of High Speed Serial Interfaces;2010-10-11
3. Gaps in Timing Margining Test;Lecture Notes in Electrical Engineering;2009-09-26
4. Noise-Insensitive Digital BIST for any PLL or DLL;Journal of Electronic Testing;2008-02-01