Transmitter Jitter Extractions on ATE

Author:

Fan Yongquan,Zilic Zeljko

Publisher

Springer Netherlands

Reference22 articles.

1. Y. Fan, Y. Cai and Z. Zilic, "A High Accuracy, High Throughput Jitter Test Solution on ATE for 3 Gbps and 6 Gbps Serial-ATA," Proceedings of IEEE International Test Conference, Oct. 2007

2. S. Sunter, A. Roy, and J. Cote, “An Automated, Complete, Structural Test Solution for SERDES,” Proceedings of IEEE International Test Conference, 2004

3. W. Fritzsche and A. Haque, “Low Cost Testing of Multi-GBit Device Pins with ATE Assisted Loopback Instrument,” Proceedings of IEEE International Test Conference, Oct. 2008

4. A. Meixner, A. Kakizawa, B. Provost, and S. Bedwani, “External Loopback Testing Experience with High Speed Serial Interfaces,” Proceedings of IEEE International Test Conference, Oct. 2008

5. B. Laquai and Y. Cai “Testing Multilane Gigabit SerDes Interfaces with Jitter Injection,” Proceedings of IEEE International Test Conference, 2001

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