Author:
Fritzsche W.A.,Haque A.E.
Cited by
6 articles.
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1. Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test;2020 IEEE International Test Conference (ITC);2020-11-01
2. Testing HSSIs with or without ATE Instruments;Accelerating Test, Validation and Debug of High Speed Serial Interfaces;2010-10-11
3. Transmitter Jitter Extractions on ATE;Accelerating Test, Validation and Debug of High Speed Serial Interfaces;2010-10-11
4. Low-Cost 20 Gbps Digital Test Signal Synthesis Using SiGe and InP Logic;Journal of Electronic Testing;2010-01-15
5. Qualifying Serial Interface Jitter Rapidly and Cost-effectively;Journal of Electronic Testing;2010-01-06