Match Sensing Using Match-Line Stability in Content-Addressable Memories (CAM)
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx5/4/4625985/04625996.pdf?arnumber=4625996
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. 8F² Ternary Content Addressable Memory Array Utilizing Interface Passivated Ge Memory-Diodes With 2 × 10⁵ Self-Rectifying Ratio;IEEE Electron Device Letters;2024-05
2. Memristor Crossbar Circuit for Ternary Content‐Addressable Memory with Fine‐Tuning Operation;Advanced Intelligent Systems;2023-01-19
3. A 4T2R RRAM Bit Cell for Highly Parallel Ternary Content Addressable Memory;IEEE Transactions on Electron Devices;2021-10
4. A 65-nm 0.6-fJ/Bit/Search Ternary Content Addressable Memory Using an Adaptive Match-Line Discharge;IEEE Journal of Solid-State Circuits;2021-08
5. Low-power content addressable memory design using two-layer P-N match-line control and sensing;Integration;2020-11
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