Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7421875/7422217/07422226.pdf?arnumber=7422226
Cited by 25 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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2. Novel and Scalable Instantaneous Voltage Drop based Scan Methodology;2023 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS);2023-11-01
3. GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting;IEICE Transactions on Information and Systems;2023-10-01
4. Strategies Involved in Enhancing the Capacitive Energy Storage Characteristics of Poly(vinylidene fluoride) Based Flexible Composites;ChemistrySelect;2022-09
5. Minimum Power Test Pattern Generator for Testing VLSI Circuits;2022 6th International Conference on Devices, Circuits and Systems (ICDCS);2022-04-21
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