Affiliation:
1. School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China
Funder
National Natural Science Foundation of China
Aeronautical Science Foundation of China
Guangxi Key Laboratory of Automatic Detecting Technology and Instruments
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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1. Neural Network Based Threshold Voltage Model for 3D TLC NAND Flash;2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI);2023-08-09