Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives-Reference-Cited by-同舟云学术

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Error Characterization, Mitigation, and Recovery in Flash-Memory-Based Solid-State Drives

Published:2017-09 Issue:9 Volume:105 Page:1666-1704
ISSN:0018-9219
Container-title:Proceedings of the IEEE
language:
Short-container-title:Proc. IEEE

Author:

Cai Yu,Ghose Saugata,Haratsch Erich F.,Luo Yixin,Mutlu Onur

Funder

CMU Data Storage Systems Center

Intel Science and Technology Center

NSF

generous donations from various industrial partners, especially Intel and Seagate

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://ieeexplore.ieee.org/ielaam/5/8013039/8013174-aam.pdf

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