A CMOS-based Characterisation Platform for Emerging RRAM Technologies-Reference-Cited by-同舟云学术

A CMOS-based Characterisation Platform for Emerging RRAM Technologies

Published:2022-05-28 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Symposium on Circuits and Systems (ISCAS)
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Author:

Mifsud Andrea¹,Shen Jiawei¹,Feng Peilong¹,Xie Lijie¹,Wang Chaohan¹,Pan Yihan²,Maheshwari Sachin²,Agwa Shady²,Stathopoulos Spyros²,Wang Shiwei²,Serb Alexander²,Papavassiliou Christos¹,Prodromakis Themis²,Constandinou Timothy G.¹

Affiliation:

1. Imperial College,Department of Electrical and Electronic Engineering,London,UK,SW7 2BT

2. University of Southampton,Centre for Electronics Frontiers, Electronics and Computer Science,UK,SO17 1BJ

Funder

CHIST-ERA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9937201/9937203/09937343.pdf?arnumber=9937343

Reference26 articles.

1. International Roadmap for Devices and Systems 2020 Edition Beyond CMOS;Tech Rep,2020

2. Overview of emerging nonvolatile memory technologies

3. Design Flow for Hybrid CMOS/Memristor Systems—Part I: Modeling and Verification Steps

4. International Roadmap for Devices and Systems 2020 Edition More Moore;Tech Rep,2020

5. Pulse I-V Characterization of Non-Volatile Memory Technologies;Tech Rep,0

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