Author:
Ragheb T.,Ricketts A.,Mondal M.,Kirolos S.,Links G.M.,Narayanan V.,Massoud Y.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
13 articles.
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1. PVT Variations;Noise Contamination in Nanoscale VLSI Circuits;2022
2. Thermal Noise;Noise Contamination in Nanoscale VLSI Circuits;2022
3. Clock Uncertainty and Power Supply Noise;Noise Contamination in Nanoscale VLSI Circuits;2022
4. Introduction;Noise Contamination in Nanoscale VLSI Circuits;2022
5. Slew Merging Region Propagation for Bounded Slew and Skew Clock Tree Synthesis;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-01