Compact modeling of nano-scale trapezoidal cross-sectional FinFETs
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/6648512/6656280/06656303.pdf?arnumber=6656303
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3. Superior Performance of Gate Workfunction and Gate Dielectric Engineered Trapezoidal FinFET in the Presence of Trap Charges;Lecture Notes in Electrical Engineering;2021
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