Performance-Power Management Aware State-of – the-Art 5nm FinFET Design(5LPE) with Dual CPP from Mobile to HPC Application

Author:

Jeong Jaehun,Ko Young Gun,Son Kihwang,Kim Sung Won,Youn Kim Ju,Choi Jeongmin,Lee Hyungjong,Lee Ho,Lee Sihyung,Shin Chunghwan,Hong Heebum,Jo Sung-il,Lee Youngho,Choi Byungha,Kim Jaechul,Lee Minseong,Jung Kyunghoon,Yasuda-Masuoka Yuri,Youn Jong Mil,Jeong Gitae

Publisher

IEEE

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Statistical Device Simulation and Machine Learning of Process Variation Effects of Vertically Stacked Gate-All-Around Si Nanosheet CFETs;IEEE Transactions on Nanotechnology;2024

2. Redefining Innovation: A Journey forward in New Dimension Era;2023 International Electron Devices Meeting (IEDM);2023-12-09

3. 3-D Logic Circuit Design-Oriented Electrothermal Modeling of Vertical Junctionless Nanowire FETs;IEEE Journal on Exploratory Solid-State Computational Devices and Circuits;2023-12

4. Reliability Assessment of 3nm GAA Logic Technology Featuring Multi-Bridge-Channel FETs;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03

5. Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3