Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk-Reference-Cited by-同舟云学术

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Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk

Published:2014-09 Issue:9 Volume:22 Page:1980-1989
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Tsai Ming-Hong,Ding Wei-Sheng,Hsieh Hung-Yi,Li James Chien-Mo

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/6881768/06605619.pdf?arnumber=6605619

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Risk Propagation Based Vector Profiling for High Coverage Dynamic IR-Drop Analysis;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28

2. GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting;IEICE Transactions on Information and Systems;2023-10-01

3. Analysis of Simultaneous Switching Noise and IR-Drop in Side-Contact Multilayer Graphene Nanoribbon Power Distribution Network;Journal of Circuits, Systems and Computers;2017-08-23

4. IGS: The Novel Fast IC Power Ground Network Optimization Flow Based on Improved Gauss-Seidel Method;Advances in Science, Technology and Engineering Systems Journal;2017-06

5. Test Pattern Modification for Average IR-Drop Reduction;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2016-01

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