Author:
Ding Wei-Sheng,Hsieh Hung-Yi,Han Cheng-Yu,Li James Chien-Mo,Wen Xiaoqing
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
6 articles.
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1. Design a PnR Flow Implementation for Different IR Drop Targets;2023 2nd International Conference on Vision Towards Emerging Trends in Communication and Networking Technologies (ViTECoN);2023-05-05
2. A Hybrid Approach to Automated Power and IR drop reduction and Classification using Support Vector Machines;2022 IEEE North Karnataka Subsection Flagship International Conference (NKCon);2022-11-20
3. Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor;2022 23rd International Symposium on Quality Electronic Design (ISQED);2022-04-06
4. A Bypassable Scan Flip-Flop for Low Power Testing With Data Retention Capability;IEEE Transactions on Circuits and Systems II: Express Briefs;2022-02
5. On‐chip generation of primary input sequences for multicycle functional broadside tests;IET Computers & Digital Techniques;2018-01-12