On‐chip generation of primary input sequences for multicycle functional broadside tests
Author:
Affiliation:
1. School of ECEPurdue University465 Northwestern AvenueWest LafayetteIN47907USA
Publisher
Institution of Engineering and Technology (IET)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1049/iet-cdt.2017.0032
Reference22 articles.
1. Rearick J.: ‘Too much delay fault coverage is a bad thing’.Proc. Int. Test Conf. 2001 pp.624–633
2. Saxena J. Butler K.M. Jayaram V.B. et al.: ‘A case study of IR‐drop in structured at‐speed testing’.Proc. Int. Test Conf. 2003 pp.1098–1104
3. Sde‐Paz S. Salomon E.: ‘Frequency and power correlation between at‐speed scan and functional tests’.Proc. Int. Test Conf. 2008 Paper 13.3 pp.1–9
4. Generation of functional broadside tests for transition faults;Pomeranz I.;IEEE Trans. Comput.‐Aided Des.,2006
5. Valka M. Bosio A. Dilillo L. et al.: ‘A functional power evaluation flow for defining test power limits during at‐speed delay testing’.Proc. IEEE European Test Symp. 2011 pp.153–158
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3