Author:
Weifeng Sun ,Chunwei Zhang ,Siyang Liu ,Longxing Shi ,Wei Su ,Aijun Zhang ,Shaorong Wang ,Shulang Ma
Funder
Hong Kong, Macao, and Taiwan Science and Technology Cooperation Program of China
Distinguished Young Scientists Foundation of Jiangsu Province
National Natural Science Foundation of China
Qing Lan Project, and Scientific Research Foundation of Graduate School of Southeast University
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
15 articles.
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