A Fast ON-State Voltage Measurement Circuit for Power Devices Characterization
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/9687117/09623477.pdf?arnumber=9623477
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Accurate Measurement of Dynamic ON-Resistance in GaN Transistors at Steady-State;IEEE Transactions on Power Electronics;2023-07
2. Analysis of a Transistor-Based On-State Voltage Measurement Circuit for Condition Monitoring of Power Transistors;2023 IEEE Applied Power Electronics Conference and Exposition (APEC);2023-03-19
3. A Fast ON-State Drain-to-Source Voltage Amplifier for the Dynamic Characterization of GaN Power Transistors;2023 IEEE Applied Power Electronics Conference and Exposition (APEC);2023-03-19
4. Active Clamp Circuit for Online ON-State Voltage Measurement of High Voltage SiC MOSFETs Power Module;2023 IEEE Applied Power Electronics Conference and Exposition (APEC);2023-03-19
5. On-line Junction Temperature Estimation Method of Power Device with Deterioration Based on on-state Voltage Measurement;2022 International Power Electronics Conference (IPEC-Himeji 2022- ECCE Asia);2022-05-15
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