A Fast ON-State Drain-to-Source Voltage Amplifier for the Dynamic Characterization of GaN Power Transistors
Author:
Affiliation:
1. Institute of Robust Power Semiconductor Systems (ILH), University of Stuttgart,Stuttgart,Germany
Funder
German Research Foundation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10131044/10130846/10131492.pdf?arnumber=10131492
Reference12 articles.
1. On-State Voltage Measurement of Fast Switching Power Semiconductors
2. A Fast Voltage Clamp Circuit for the Accurate Measurement of the Dynamic ON-Resistance of Power Transistors
3. Evidence of Hot-Electron Effects During Hard Switching of AlGaN/GaN HEMTs
4. A Fast ON-State Voltage Measurement Circuit for Power Devices Characterization
5. Design of a Fast Dynamic On-Resistance Measurement Circuit for GaN Power HEMTs
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