On-line Junction Temperature Estimation Method of Power Device with Deterioration Based on on-state Voltage Measurement
Author:
Affiliation:
1. Meidensha Corporation,Shizuoka,Japan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9806820/9806821/09806836.pdf?arnumber=9806836
Reference13 articles.
1. Transitioning to Physics-of-Failure as a Reliability Driver in Power Electronics
2. Accurate Online Junction Temperature Estimation of IGBT Using Inflection Point Based Updated I–V Characteristics
3. On-State Voltage Measurement of Fast Switching Power Semiconductors
4. A Fully Digitalized Speed Regulator using Multimicroprocessor System for Induction Motor Drives
5. An Online Junction Temperature Monitoring Method for SiC MOSFETs Based on a Novel Gate Conduction Model
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