Author:
Georgakidis Christos,Paliaroutis Georgios Ioannis,Sketopoulos Nikolaos,Tsoumanis Pelopidas,Sotiriou Christos,Evmorfopoulos Nestor,Stamoulis Georgios
Cited by
8 articles.
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1. Accurate Soft Error Rate Evaluation Using Event-Driven Dynamic Timing Analysis;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03
2. Addressing Single-Event-Multiple-Transient Faults in Asynchronous RH-Click Controllers;2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2023-08-28
3. RADPlace-MS: A Timing-Driven Placer and Optimiser for ASICs Radiation Hardening;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
4. META: A Layout Based Tool to Estimate the Vulnerability of Digital Circuits to Multiple Event Transient;2022 20th IEEE Interregional NEWCAS Conference (NEWCAS);2022-06-19
5. RADPlace: A Timing-aware RAdiation-Hardening Detailed Placement Scheme Satisfying TMR Spacing Constraints;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06