Accurate Soft Error Rate Evaluation Using Event-Driven Dynamic Timing Analysis
Author:
Affiliation:
1. University of Thessaly,Department of Electrical and Computer Engineering,Volos,Greece
Funder
European Regional Development Fund
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10313343/10313345/10313573.pdf?arnumber=10313573
Reference24 articles.
1. Event-driven transient error propagation: A scalable and accurate soft error rate estimation approach
2. A Sparsity-Aware MOR Methodology for Fast and Accurate Timing Analysis of VLSI Interconnects
3. Soft error derating computation in sequential circuits;asadi;proc of the IEEE/ACM International Conference on Computer Aided Design (ICCAD),2006
4. Leveraging Machine Learning for Gate-level Timing Estimation Using Current Source Models and Effective Capacitance
5. Radiation-induced soft errors in advanced semiconductor technologies
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